Microscopie électronique à balayage (MEB) Scanning Electron Microscopy (SEM)
Philippe A. Buffat EPFL-CIME

See also:

A Guide to Scanning Microscope Observation on the JEOL WEB site: http://www.jeol.com/downloads.html L. Reimer, Scanning Electron Microscopy (Springer Verlag 1985) (also in German:Rasterelektronenmikroskopie)

Scanning Electron Microscopy training 03-04 / philippe.buffat@epfl.ch / 1

Short bibliography SEM and EDS
Basic: L. Reimer, Scanning Electron Microscopy, (Springer Verlag 1985), also in German J. I. Goldstein et al., Scanning Electron Microscopy and X-ray Microanalysis, Plenum (second edition, 1992) Lyman et al, Scanning electron microscopy, X-ray microanalysis and analytical electron microscopy, Plenum (1990) D.E. Newbury, Advanced Scanning Electron Microscopy and X-ray Microanalysis, Plenum (1986) J. I. Goldstein, H. Yakowitz, D. E. Newbury, E. Lifshin, J. W. Colby, J. R. Coleman, Pratical scanning electron microscopy, Pleneum (1975) Special applications: D. B Holt, D. C. Joy, SEM microcharacterization of semiconductors, Academic Press (1989) B. G. Yacobi, D. B. Holt, Cathodoluminescence microscopy of inorganic solids, Plenum Press (1990) Multitechnics: R.W. Cahn et al., Materials Science and Technology, Characterization of Materials (vol. 1 and 2), VCH (1992) S. Amelinckx et al, Handbook of Microscopy: Applications in Material Science, Solid State Physics and Chemistry (vol. 1 and 2), VCH (1997) E. Fuchs, H. Oppolzer, H. Rehme, Particle Beam Microanalysis, VCH Verlag 1990) In French: J.P. Eberhart, Analyse structurale et chimique des matériaux, Dunod, (1989) Ruste, Pratique du microscope électronique à balayage, ANRT (1985) D. Benoit, F. Grillon, F. Maurice, N. Roinel, J. Ruste, R. Tixier, Microanalyse par sonde électronique: spectometrie de rayons X, ANRT (1987) D. Benoit, G. Brault, J. F. Bresse, F. Grillon, F. Maurice, J. L. Pouchou, J. Ruste, Microanalyse par sonde électronique: aspects quantitatifs, ANRT (1989) J. Ruste, J.F.